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The correlation between electrical properties and quantitative defect analysis as a function of electrode junction type of amorphous indium tin zinc oxide thin film transistor
- Authors
- 정권범
- Issue Date
- 28-Oct-2024
- Place
- 대한민국
- Conference Name
- The 7th intenational conference on active materials and soft mechanics (AMSM2024)
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)