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Amorphous indium-tin-zinc oxide thin film transistor correlation between electrical properties and defect analysis as a function of conductive homojunction layer insertion electrode
- Authors
- 정권범
- Issue Date
- 13-Nov-2024
- Place
- 일본
- Conference Name
- MNC 2024
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)