Detailed Information
Cited 0 time in 
Cited 1 time in 
Cited 1 time in
Metadata Downloads
Design of an Edge Detected CMOS Image Sensor for an Intelligent Pattern Recognition
- Authors
- Lee, Hohyeon; Kim, Soo Youn; Song, Minkyu
- Issue Date
- 2022
- Publisher
- IEEE
- Keywords
- configurable ADC; digital signal processing; edge detected CMOS image sensor; intelligent pattern recognition; two-step single-slope analog-to-digital converter
- Citation
- 2022 6th International Conference on Information Technology (InCIT), pp 92 - 95
- Pages
- 4
- Indexed
- FOREIGN
- Journal Title
- 2022 6th International Conference on Information Technology (InCIT)
- Start Page
- 92
- End Page
- 95
- Abstract
- Normally, a pattern recognition has been studied in the field of digital signal processing with digital codes. Even though it has very accurate results, it needs a lot of power consumption, very long operating time, and huge hardware bundles. In this paper, an edge detected CMOS image sensor for an intelligent pattern recognition is proposed. Further, an efficient edge detection algorithm is also described. With the new techniques, a low power and high speed pattern recognition is available in the field of CMOS image sensor. The image sensor is composed of photodiodes, a two-step single-slope 8-bit analog-to-digital converter, static random memories, and etc. The testing sensor has been implemented with an 180nm technology. It has a very excellent measured results, compared to other published chips. © 2022 IEEE.
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Kim, Soo Youn
- College of Advanced Convergence Engineering (Division of System Semiconductor)