Design of an Edge Detected CMOS Image Sensor for an Intelligent Pattern Recognition

Abstract

Normally, a pattern recognition has been studied in the field of digital signal processing with digital codes. Even though it has very accurate results, it needs a lot of power consumption, very long operating time, and huge hardware bundles. In this paper, an edge detected CMOS image sensor for an intelligent pattern recognition is proposed. Further, an efficient edge detection algorithm is also described. With the new techniques, a low power and high speed pattern recognition is available in the field of CMOS image sensor. The image sensor is composed of photodiodes, a two-step single-slope 8-bit analog-to-digital converter, static random memories, and etc. The testing sensor has been implemented with an 180nm technology. It has a very excellent measured results, compared to other published chips. © 2022 IEEE.