Electrical and optical artificial synapses properties of TiN-nanoparticles incorporated HfAlO-alloy based memristor
- Authors
- Mahata, Chandreswar; Kim, Sungjun
- Issue Date
- Dec-2021
- Publisher
- PERGAMON-ELSEVIER SCIENCE LTD
- Keywords
- RRAM; Al-doped HfO2; ALD TiN-nanoparticles; Synaptic properties; Optical response
- Citation
- CHAOS SOLITONS & FRACTALS, v.153
- Indexed
- SCIE
SCOPUS
- Journal Title
- CHAOS SOLITONS & FRACTALS
- Volume
- 153
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/20900
- DOI
- 10.1016/j.chaos.2021.111518
- ISSN
- 0960-0779
1873-2887
- Abstract
- Resistive switching behavior of sandwiched HfAlO/TiN-NP/HfAlO switching layer demonstrated in this work. Stable 10 3 DC switching cycles achieved after incorporation of TiN-NPs, which were partially ox-idized to form TiOxNy confirmed by X-ray photoelectron spectroscopy. The experiment predicted that TiOxNy/HfAlO interface acts as a weak spot and facilitated the rapture and formation of the conductive filaments. Also, gradual switching behavior between low resistance state and high resistance state im-proved after introducing atomic layer deposited TiN-NPs into the switching layer. Several synaptic prop-erties have been studied, including potentiation/depression under different pulse schemes, spike-time-dependent plasticity, spike-rate-dependent plasticity at the frequency of 2 Hz to 200 Hz, and short-term plasticity under different pulse amplitudes. These properties demonstrated that ITO/HfAlO/TiN-NP/HfAlO/ITO RRAM device is suitable for the neuromorphic application. Light-induced modulation of increasing current and relaxation behavior using a 405 nm laser source further confirms the possibility for light-induced random access memory devices. (C) 2021 Elsevier Ltd. All rights reserved.
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