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Improvement of bias instability in tungsten-indium-zinc oxide thin film transistor via simultaneous ultra-violet and thermal annealing
- Authors
- 정권범
- Issue Date
- 24-Apr-2019
- Place
- 대한민국
- Conference Name
- 2019 봄 한국물리학회 학술논문발표회(2019 KPS Spring Meeting)
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)