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Improvement of bias instability in tungsten-indium-zinc oxide thin film transistor via simultaneous ultra-violet and thermal annealing
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정권범 | - |
| dc.date.accessioned | 2023-05-11T17:41:03Z | - |
| dc.date.available | 2023-05-11T17:41:03Z | - |
| dc.date.issued | 2019-04-24 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/13722 | - |
| dc.title | Improvement of bias instability in tungsten-indium-zinc oxide thin film transistor via simultaneous ultra-violet and thermal annealing | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2019 봄 한국물리학회 학술논문발표회(2019 KPS Spring Meeting) | - |
| dc.citation.conferencePlace | 대한민국 | - |
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Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)