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3D Vertical Ferroelectric Capacitors with Excellent Scalability

Lim, Eunjin; Park, Yongjin; Youn, Chaewon; Kim, Sungjun

ArticleIssue Date2025CitationNano Letters, v.25, no.6, pp 2166 - 2172PublisherAmerican Chemical Society
SCIESCOPUS
Artificial Neural Network Classification Using Al-Doped HfOx‑Based Ferroelectric Tunneling Junction with Self-Rectifying Behaviors

Lim, Eunjin; Ju, Dongyeol; Lee, Jungwoo; Park, Yongjin; Kim, Min-Hwi; Kim, Sungjun

ArticleIssue Date2024CitationACS Materials Letters, v.6, no.6, pp 2320 - 2328PublisherAmerican Chemical Society
SCIESCOPUS
Depolarization Field Controllable HfZrO x -Based Ferroelectric Capacitors for Physical Reservoir Computing System

Seo, Euncho; Lim, Eunjin; Shin, Jio; Kim, Sungjun

ArticleIssue Date2025CitationACS Applied Materials & Interfaces, v.17, no.14, pp 21401 - 21409PublisherAmerican Chemical Society
SCIESCOPUS
Exploration of Analog Synaptic Plasticity and Convolutional Neural Network Simulation in Bilayer TiOxNy/SnOx Memristor for Neuromorphic Systems

Ismail, Muhammad; Kim, Doohyung; Lim, Eunjin; Rasheed, Maria; Mahata, Chandreswar; Seo, Yeongkyo; Kim, Sungjun

ArticleIssue Date2024CitationACS Materials Letters, v.6, no.8, pp 3514 - 3522PublisherAmerican Chemical Society
SCIESCOPUS
Ferroelectric memristor crossbar arrays for highly integrated neuromorphic computing systemopen access

Park, Yongjin; Lim, Eunjin; Lee, Seungjun; Georgiev, Vihar; Kim, Sungjoon; Kim, Sungjun

ArticleIssue Date2025CitationNano Energy, v.141, pp 1 - 11PublisherElsevier Ltd
SCIESCOPUS
Impact of annealing temperature on the remanent polarization and tunneling electro-resistance of ferroelectric Al-doped HfOx tunnel junction memoryopen access

Kim, Jihyung; Kwon, Osung; Lim, Eunjin; Kim, Dahye; Kim, Sungjun

ArticleIssue Date2023CitationPhysical Chemistry Chemical Physics, v.25, no.6, pp 4588 - 4597PublisherRoyal Society of Chemistry
SCIESCOPUS
Impact of HfO2 Dielectric Layer Placement in Hf0.5Zr0.5O2-Based Ferroelectric Tunnel Junctions for Neuromorphic Applications

Kim, Juri; Park, Yongjin; Lee, Jungwoo; Lim, Eunjin; Lee, Jung-Kyu; Kim, Sungjun

ArticleIssue Date2024CitationAdvanced Materials Technologies, v.9, no.10, pp 1 - 8PublisherWiley-VCH GmbH
SCIESCOPUS
Influence of the TiN diffusion barrier on the leakage current and ferroelectricity in an Al-doped HfOx ferroelectric memristor and its application to neuromorphic computing

Lim, Eunjin; Seo, Euncho; Kim, Sungjun

ArticleIssue Date2024CitationNanoscale, v.16, no.41, pp 19445 - 19452PublisherRoyal Society of Chemistry
SCIESCOPUS
Recent advances in the mechanism, properties, and applications of hafnia ferroelectric tunnel junctions

Lim, Eunjin; Kim, Dahye; Park, Jongmin; Koo, Minsuk; Kim, Sungjun

ArticleIssue Date2024CitationJournal of Physics D: Applied Physics, v.57, no.47, pp 1 - 18PublisherIOP Publishing Ltd.
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