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Enhancing reliability of amorphous In-Ga-Zn-O thin film transistors by nitrogen doping
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sung, T. | - |
| dc.contributor.author | Park, K. | - |
| dc.contributor.author | Kim, J.H. | - |
| dc.contributor.author | Park, H.-W. | - |
| dc.contributor.author | Yun, P. | - |
| dc.contributor.author | Non, J. | - |
| dc.contributor.author | Lee, S. | - |
| dc.contributor.author | Park, K.-S. | - |
| dc.contributor.author | Yoon, S. | - |
| dc.contributor.author | Kang, I. | - |
| dc.contributor.author | Chung, K.-B. | - |
| dc.contributor.author | Kim, H.-S. | - |
| dc.contributor.author | Kwon, J.-Y. | - |
| dc.date.accessioned | 2023-04-28T10:40:29Z | - |
| dc.date.available | 2023-04-28T10:40:29Z | - |
| dc.date.issued | 2018 | - |
| dc.identifier.issn | 1883-2490 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/9902 | - |
| dc.description.abstract | Device reliability and electrical properties of the a-IGZO Thin-film Transistors (TFTs) were analyzed in relation to the amount of nitrogen incorporated in the a-IGZO channel. The reliability of the a-IGZO TFTs was enhanced owing to the incorporated nitrogen, and the corresponding mechanism was studied by simulation and experiment. © 2018 International Display Workshops. All rights reserved. | - |
| dc.format.extent | 4 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | International Display Workshops | - |
| dc.title | Enhancing reliability of amorphous In-Ga-Zn-O thin film transistors by nitrogen doping | - |
| dc.type | Article | - |
| dc.identifier.scopusid | 2-s2.0-85072102490 | - |
| dc.identifier.bibliographicCitation | Proceedings of the International Display Workshops, v.1, pp 287 - 290 | - |
| dc.citation.title | Proceedings of the International Display Workshops | - |
| dc.citation.volume | 1 | - |
| dc.citation.startPage | 287 | - |
| dc.citation.endPage | 290 | - |
| dc.type.docType | Conference Paper | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordAuthor | IGZO | - |
| dc.subject.keywordAuthor | Nitrogen | - |
| dc.subject.keywordAuthor | Reliability | - |
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Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)