Fabrication of Eu doped CdO [Al/Eu-nCdO/p-Si/Al] photodiodes by perfume atomizer based spray technique for opto-electronic applications
- Authors
- Ravikumar, M.; Ganesh, V.; Shkir, Mohd; Chandramohan, R.; Kumar, K. Deva Arun; Valanarasu, S.; Kathalingam, A.; AlFaify, S.
- Issue Date
- 15-May-2018
- Publisher
- ELSEVIER SCIENCE BV
- Keywords
- Thin films; Doping; Oxides semiconductors; Optical properties; Heterojunction devices; Electrical properties
- Citation
- JOURNAL OF MOLECULAR STRUCTURE, v.1160, pp 311 - 318
- Pages
- 8
- Indexed
- SCI
SCIE
SCOPUS
- Journal Title
- JOURNAL OF MOLECULAR STRUCTURE
- Volume
- 1160
- Start Page
- 311
- End Page
- 318
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/9511
- DOI
- 10.1016/j.molstruc.2018.01.095
- ISSN
- 0022-2860
1872-8014
- Abstract
- In this study, thin films of cadmium oxide (CdO) with different concentrations (0, 1, 3, and 5 wt%) of Eu doping were deposited onto Si and glass substrates by a novel and facile spray technique using simple perfume atomizer for the first time. Prepared films were characterized for structural, morphological, optical properties and the photo diode studies, using X-ray diffraction, scanning electron microscope, UV-Vis spectrophotometer, I-V characteristics, and fundamental parameters are reported. All the prepared Eu:CdO films exhibit cubic structure. The preferential orientation is along (200) plane. Scanning electron microscopy study indicates the growth of smooth and pin-hole free films with clusters of homogeneous grains. The values of band gap energy are found to be varying from 2.42 to 2.33 eV for various Eu doping concentration from 0 to 5 wt%. EDAX studies revealed the presence of Eu, Cd and O elements without any other impurities. FTIR spectra showed a peak at 575 cm(-1) confirming the stretching mode of Cd-O. The resistivity (rho), high carrier concentration (n) and carrier mobility (mu) for 3 wt% CdO thin film are found to be 0.452 x 10(-3)(Omega.cm), 17.82 x 10(20) cm(-3) and 7.757 cm(2)/V, respectively. Current-voltage measurements on the fabricated nanostructured Al/Eu-nCdO/p-Si/Al heterojunction device showed a non-linear electric characteristics indicating diode like behaviour. (C) 2018 Elsevier B.V. All rights reserved.
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Collections - College of Engineering > ETC > 1. Journal Articles

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