Detailed Information

Cited 28 time in webofscience Cited 32 time in scopus
Metadata Downloads

Fabrication of Eu doped CdO [Al/Eu-nCdO/p-Si/Al] photodiodes by perfume atomizer based spray technique for opto-electronic applications

Authors
Ravikumar, M.Ganesh, V.Shkir, MohdChandramohan, R.Kumar, K. Deva ArunValanarasu, S.Kathalingam, A.AlFaify, S.
Issue Date
15-May-2018
Publisher
ELSEVIER SCIENCE BV
Keywords
Thin films; Doping; Oxides semiconductors; Optical properties; Heterojunction devices; Electrical properties
Citation
JOURNAL OF MOLECULAR STRUCTURE, v.1160, pp 311 - 318
Pages
8
Indexed
SCI
SCIE
SCOPUS
Journal Title
JOURNAL OF MOLECULAR STRUCTURE
Volume
1160
Start Page
311
End Page
318
URI
https://scholarworks.dongguk.edu/handle/sw.dongguk/9511
DOI
10.1016/j.molstruc.2018.01.095
ISSN
0022-2860
1872-8014
Abstract
In this study, thin films of cadmium oxide (CdO) with different concentrations (0, 1, 3, and 5 wt%) of Eu doping were deposited onto Si and glass substrates by a novel and facile spray technique using simple perfume atomizer for the first time. Prepared films were characterized for structural, morphological, optical properties and the photo diode studies, using X-ray diffraction, scanning electron microscope, UV-Vis spectrophotometer, I-V characteristics, and fundamental parameters are reported. All the prepared Eu:CdO films exhibit cubic structure. The preferential orientation is along (200) plane. Scanning electron microscopy study indicates the growth of smooth and pin-hole free films with clusters of homogeneous grains. The values of band gap energy are found to be varying from 2.42 to 2.33 eV for various Eu doping concentration from 0 to 5 wt%. EDAX studies revealed the presence of Eu, Cd and O elements without any other impurities. FTIR spectra showed a peak at 575 cm(-1) confirming the stretching mode of Cd-O. The resistivity (rho), high carrier concentration (n) and carrier mobility (mu) for 3 wt% CdO thin film are found to be 0.452 x 10(-3)(Omega.cm), 17.82 x 10(20) cm(-3) and 7.757 cm(2)/V, respectively. Current-voltage measurements on the fabricated nanostructured Al/Eu-nCdO/p-Si/Al heterojunction device showed a non-linear electric characteristics indicating diode like behaviour. (C) 2018 Elsevier B.V. All rights reserved.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > ETC > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kathalingam, Adaikalam photo

Kathalingam, Adaikalam
College of Engineering
Read more

Altmetrics

Total Views & Downloads

BROWSE