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Fabrication of Eu doped CdO [Al/Eu-nCdO/p-Si/Al] photodiodes by perfume atomizer based spray technique for opto-electronic applications

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dc.contributor.authorRavikumar, M.-
dc.contributor.authorGanesh, V.-
dc.contributor.authorShkir, Mohd-
dc.contributor.authorChandramohan, R.-
dc.contributor.authorKumar, K. Deva Arun-
dc.contributor.authorValanarasu, S.-
dc.contributor.authorKathalingam, A.-
dc.contributor.authorAlFaify, S.-
dc.date.accessioned2023-04-28T08:42:12Z-
dc.date.available2023-04-28T08:42:12Z-
dc.date.issued2018-05-15-
dc.identifier.issn0022-2860-
dc.identifier.issn1872-8014-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/9511-
dc.description.abstractIn this study, thin films of cadmium oxide (CdO) with different concentrations (0, 1, 3, and 5 wt%) of Eu doping were deposited onto Si and glass substrates by a novel and facile spray technique using simple perfume atomizer for the first time. Prepared films were characterized for structural, morphological, optical properties and the photo diode studies, using X-ray diffraction, scanning electron microscope, UV-Vis spectrophotometer, I-V characteristics, and fundamental parameters are reported. All the prepared Eu:CdO films exhibit cubic structure. The preferential orientation is along (200) plane. Scanning electron microscopy study indicates the growth of smooth and pin-hole free films with clusters of homogeneous grains. The values of band gap energy are found to be varying from 2.42 to 2.33 eV for various Eu doping concentration from 0 to 5 wt%. EDAX studies revealed the presence of Eu, Cd and O elements without any other impurities. FTIR spectra showed a peak at 575 cm(-1) confirming the stretching mode of Cd-O. The resistivity (rho), high carrier concentration (n) and carrier mobility (mu) for 3 wt% CdO thin film are found to be 0.452 x 10(-3)(Omega.cm), 17.82 x 10(20) cm(-3) and 7.757 cm(2)/V, respectively. Current-voltage measurements on the fabricated nanostructured Al/Eu-nCdO/p-Si/Al heterojunction device showed a non-linear electric characteristics indicating diode like behaviour. (C) 2018 Elsevier B.V. All rights reserved.-
dc.format.extent8-
dc.language영어-
dc.language.isoENG-
dc.publisherELSEVIER SCIENCE BV-
dc.titleFabrication of Eu doped CdO [Al/Eu-nCdO/p-Si/Al] photodiodes by perfume atomizer based spray technique for opto-electronic applications-
dc.typeArticle-
dc.publisher.location네델란드-
dc.identifier.doi10.1016/j.molstruc.2018.01.095-
dc.identifier.scopusid2-s2.0-85042717250-
dc.identifier.wosid000428483500036-
dc.identifier.bibliographicCitationJOURNAL OF MOLECULAR STRUCTURE, v.1160, pp 311 - 318-
dc.citation.titleJOURNAL OF MOLECULAR STRUCTURE-
dc.citation.volume1160-
dc.citation.startPage311-
dc.citation.endPage318-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusELECTRICAL-PROPERTIES-
dc.subject.keywordPlusOPTICAL-PROPERTIES-
dc.subject.keywordPlusSUBSTRATE-TEMPERATURE-
dc.subject.keywordPlusPHYSICAL-PROPERTIES-
dc.subject.keywordPlusASSISTED SYNTHESIS-
dc.subject.keywordPlusRESISTIVITY-
dc.subject.keywordPlusNANOSTRUCTURES-
dc.subject.keywordPlusIRRADIATION-
dc.subject.keywordAuthorThin films-
dc.subject.keywordAuthorDoping-
dc.subject.keywordAuthorOxides semiconductors-
dc.subject.keywordAuthorOptical properties-
dc.subject.keywordAuthorHeterojunction devices-
dc.subject.keywordAuthorElectrical properties-
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