Direct patterning of reduced graphene oxide/graphene oxide memristive heterostructures by electron-beam irradiation
- Authors
- Kapitanova, Olesya O.; Emelin, Evgeny, V; Dorofeev, Sergey G.; Evdokimov, Pavel, V; Panin, Gennady N.; Lee, Youngmin; Lee, Sejoon
- Issue Date
- 1-Feb-2020
- Publisher
- JOURNAL MATER SCI TECHNOL
- Keywords
- Electron beam irradiation; Reduced graphene oxide; Graphene oxide; Memristive heterostructure
- Citation
- JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, v.38, pp 237 - 243
- Pages
- 7
- Indexed
- SCIE
SCOPUS
- Journal Title
- JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
- Volume
- 38
- Start Page
- 237
- End Page
- 243
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/6919
- DOI
- 10.1016/j.jmst.2019.07.042
- ISSN
- 1005-0302
- Abstract
- Memristive heterostructures, composed of reduced graphene oxide with different degree of reduction, were demonstrated through a simple method of 'direct electron-beam writing' on graphene oxide. Irradiation with an electron beam at various doses and accelerating voltages made it possible to define highand low-conductivity graphene-oxide areas. The electron beam-reduced graphene oxide/graphene oxide heterostructure clearly exhibited a nonlinear behavior and a well-controlled resistive switching characteristic at a low operating-voltage range (< 1 V). The proposed memristive heterostructures are promising for highly-efficient digital storage and information process as well as for analogous neuromorphic computations. (C) 2019 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology.
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Collections - College of Advanced Convergence Engineering > Division of System Semiconductor > 1. Journal Articles

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