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Cited 23 time in webofscience Cited 23 time in scopus
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Direct patterning of reduced graphene oxide/graphene oxide memristive heterostructures by electron-beam irradiation

Authors
Kapitanova, Olesya O.Emelin, Evgeny, VDorofeev, Sergey G.Evdokimov, Pavel, VPanin, Gennady N.Lee, YoungminLee, Sejoon
Issue Date
1-Feb-2020
Publisher
JOURNAL MATER SCI TECHNOL
Keywords
Electron beam irradiation; Reduced graphene oxide; Graphene oxide; Memristive heterostructure
Citation
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, v.38, pp 237 - 243
Pages
7
Indexed
SCIE
SCOPUS
Journal Title
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
Volume
38
Start Page
237
End Page
243
URI
https://scholarworks.dongguk.edu/handle/sw.dongguk/6919
DOI
10.1016/j.jmst.2019.07.042
ISSN
1005-0302
Abstract
Memristive heterostructures, composed of reduced graphene oxide with different degree of reduction, were demonstrated through a simple method of 'direct electron-beam writing' on graphene oxide. Irradiation with an electron beam at various doses and accelerating voltages made it possible to define highand low-conductivity graphene-oxide areas. The electron beam-reduced graphene oxide/graphene oxide heterostructure clearly exhibited a nonlinear behavior and a well-controlled resistive switching characteristic at a low operating-voltage range (< 1 V). The proposed memristive heterostructures are promising for highly-efficient digital storage and information process as well as for analogous neuromorphic computations. (C) 2019 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology.
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