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Direct patterning of reduced graphene oxide/graphene oxide memristive heterostructures by electron-beam irradiation
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kapitanova, Olesya O. | - |
| dc.contributor.author | Emelin, Evgeny, V | - |
| dc.contributor.author | Dorofeev, Sergey G. | - |
| dc.contributor.author | Evdokimov, Pavel, V | - |
| dc.contributor.author | Panin, Gennady N. | - |
| dc.contributor.author | Lee, Youngmin | - |
| dc.contributor.author | Lee, Sejoon | - |
| dc.date.accessioned | 2023-04-28T00:40:44Z | - |
| dc.date.available | 2023-04-28T00:40:44Z | - |
| dc.date.issued | 2020-02-01 | - |
| dc.identifier.issn | 1005-0302 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/6919 | - |
| dc.description.abstract | Memristive heterostructures, composed of reduced graphene oxide with different degree of reduction, were demonstrated through a simple method of 'direct electron-beam writing' on graphene oxide. Irradiation with an electron beam at various doses and accelerating voltages made it possible to define highand low-conductivity graphene-oxide areas. The electron beam-reduced graphene oxide/graphene oxide heterostructure clearly exhibited a nonlinear behavior and a well-controlled resistive switching characteristic at a low operating-voltage range (< 1 V). The proposed memristive heterostructures are promising for highly-efficient digital storage and information process as well as for analogous neuromorphic computations. (C) 2019 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology. | - |
| dc.format.extent | 7 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | JOURNAL MATER SCI TECHNOL | - |
| dc.title | Direct patterning of reduced graphene oxide/graphene oxide memristive heterostructures by electron-beam irradiation | - |
| dc.type | Article | - |
| dc.publisher.location | 중국 | - |
| dc.identifier.doi | 10.1016/j.jmst.2019.07.042 | - |
| dc.identifier.scopusid | 2-s2.0-85076054129 | - |
| dc.identifier.wosid | 000503164100025 | - |
| dc.identifier.bibliographicCitation | JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, v.38, pp 237 - 243 | - |
| dc.citation.title | JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY | - |
| dc.citation.volume | 38 | - |
| dc.citation.startPage | 237 | - |
| dc.citation.endPage | 243 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Metallurgy & Metallurgical Engineering | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Metallurgy & Metallurgical Engineering | - |
| dc.subject.keywordPlus | FIELD-EFFECT TRANSISTOR | - |
| dc.subject.keywordPlus | TRANSPARENT | - |
| dc.subject.keywordAuthor | Electron beam irradiation | - |
| dc.subject.keywordAuthor | Reduced graphene oxide | - |
| dc.subject.keywordAuthor | Graphene oxide | - |
| dc.subject.keywordAuthor | Memristive heterostructure | - |
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