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Defect-State-Driven Threshold Voltage Modulation in IGZO Thin-Film Transistors Using Femtosecond Laser Annealing
- Authors
- 정권범
- Issue Date
- 19-Nov-2025
- Place
- 일본
- Conference Name
- MNC
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)