[CN]전계 발광 시료 분석 장치

조훈영; 곽동욱; 이동화; 최현열

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[CN]전계 발광 시료 분석 장치APPARATUS FOR INSPECTION OF ELECTROLUMINESCENCE SAMPLE

Alternative Title: APPARATUS FOR INSPECTION OF ELECTROLUMINESCENCE SAMPLE

Authors: 조훈영; 곽동욱; 이동화; 최현열

URI: https://scholarworks.dongguk.edu/handle/sw.dongguk/59506

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Appears in Collections: College of Natural Science > Department of Physics > 4. Patents

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