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[CN]전계 발광 시료 분석 장치

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dc.contributor.author조훈영-
dc.contributor.author곽동욱-
dc.contributor.author이동화-
dc.contributor.author최현열-
dc.date.accessioned2025-09-09T06:36:23Z-
dc.date.available2025-09-09T06:36:23Z-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/59506-
dc.title[CN]전계 발광 시료 분석 장치-
dc.title.alternativeAPPARATUS FOR INSPECTION OF ELECTROLUMINESCENCE SAMPLE-
dc.typePatent-
dc.publisher.location중국-
dc.contributor.assignee동국대학교산학협력단-
dc.date.application2011-03-31-
dc.date.registration2014-12-31-
dc.type.iprs특허-
dc.identifier.patentRegistrationNumberZL 201180022720.2-
dc.identifier.patentApplicationNumber201180022720.2-
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College of Natural Science > Department of Physics > 4. Patents

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