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Devices stability of Ga-doped InZnSnO thin film transistors using quantitative analysis as a function of oxygen-related defect states
- Authors
- 정권범
- Issue Date
- 28-Mar-2024
- Place
- 대한민국
- Conference Name
- ITC 2024 (The 18th International Thin-Film Transistor Conference)
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)