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Classification of computed tomography scanner manufacturer using support vector machine
- Authors
- 손윤식
- Issue Date
- 9-Jan-2017
- Place
- 대한민국
- Conference Name
- 2017 5th International Winter Conference on Brain-Computer Interface
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Related Researcher
- Son, Yun Sik
- College of Advanced Convergence Engineering (Department of Computer Science and Artificial Intelligence)