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Classification of computed tomography scanner manufacturer using support vector machine
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 손윤식 | - |
| dc.date.accessioned | 2024-10-30T19:44:41Z | - |
| dc.date.available | 2024-10-30T19:44:41Z | - |
| dc.date.issued | 2017-01-09 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/54292 | - |
| dc.title | Classification of computed tomography scanner manufacturer using support vector machine | - |
| dc.type | Conference | - |
| dc.citation.startPage | 85 | - |
| dc.citation.endPage | 87 | - |
| dc.citation.conferenceName | 2017 5th International Winter Conference on Brain-Computer Interface | - |
| dc.citation.conferencePlace | 대한민국 | - |
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Related Researcher
- Son, Yun Sik
- College of Advanced Convergence Engineering (Department of Computer Science and Artificial Intelligence)