Nonlinear Profile monitoring for Intelligent Quality Diagnosis: Focusing on Using Wavelet

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Nonlinear Profile monitoring for Intelligent Quality Diagnosis: Focusing on Using Wavelet

Authors: 정욱

Issue Date: 31-Jul-2016

URI: https://scholarworks.dongguk.edu/handle/sw.dongguk/52972

Place: 중국
Nanjing University of Science & Technology

Conference Date: 2016-07-30 ~ 2016-08-01

Conference Name: The 15th China-Korea Bilateral Symposium on Quality

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Appears in Collections: Dongguk Business School > Department of Business Administration > 2. Conference Papers

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