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Nonlinear Profile monitoring for Intelligent Quality Diagnosis: Focusing on Using Wavelet
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정욱 | - |
| dc.date.accessioned | 2024-10-30T18:24:09Z | - |
| dc.date.available | 2024-10-30T18:24:09Z | - |
| dc.date.issued | 2016-07-31 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/52972 | - |
| dc.title | Nonlinear Profile monitoring for Intelligent Quality Diagnosis: Focusing on Using Wavelet | - |
| dc.type | Conference | - |
| dc.citation.startPage | 10 | - |
| dc.citation.endPage | 20 | - |
| dc.citation.conferenceName | The 15th China-Korea Bilateral Symposium on Quality | - |
| dc.citation.conferencePlace | 중국 | - |
| dc.citation.conferencePlace | Nanjing University of Science & Technology | - |
| dc.citation.conferenceDate | 2016-07-30 ~ 2016-08-01 | - |
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