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Exoelectron emission spectroscopy and capacitance transient spectroscopy for deeper nitride charge trap in ONO structures
- Authors
- 조훈영
- Issue Date
- 10-Jun-2009
- Place
- 독일
스트라스브르그
- Conference Date
- 2009-06-08 ~ 2009-06-12
- Conference Name
- EMRS 2009
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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