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Exoelectron emission spectroscopy and capacitance transient spectroscopy for deeper nitride charge trap in ONO structures
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조훈영 | - |
| dc.date.accessioned | 2024-10-30T06:22:26Z | - |
| dc.date.available | 2024-10-30T06:22:26Z | - |
| dc.date.issued | 2009-06-10 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/42183 | - |
| dc.title | Exoelectron emission spectroscopy and capacitance transient spectroscopy for deeper nitride charge trap in ONO structures | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | EMRS 2009 | - |
| dc.citation.conferencePlace | 독일 | - |
| dc.citation.conferencePlace | 스트라스브르그 | - |
| dc.citation.conferenceDate | 2009-06-08 ~ 2009-06-12 | - |
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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