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Role of Nitride Traps in NBTI of Charge Trap Flaash Memory with Oxide-Nitride-Al2O3(ONA) Structures
- Authors
- 조훈영
- Issue Date
- 7-Oct-2009
- Place
- 오스트리아
비엔나
- Conference Date
- 2009-10-04 ~ 2009-10-09
- Conference Name
- 216th Electrochemical Society Meeting
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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