Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Role of Nitride Traps in NBTI of Charge Trap Flaash Memory with Oxide-Nitride-Al2O3(ONA) Structures
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조훈영 | - |
| dc.date.accessioned | 2024-10-30T06:22:26Z | - |
| dc.date.available | 2024-10-30T06:22:26Z | - |
| dc.date.issued | 2009-10-07 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/42181 | - |
| dc.title | Role of Nitride Traps in NBTI of Charge Trap Flaash Memory with Oxide-Nitride-Al2O3(ONA) Structures | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 216th Electrochemical Society Meeting | - |
| dc.citation.conferencePlace | 오스트리아 | - |
| dc.citation.conferencePlace | 비엔나 | - |
| dc.citation.conferenceDate | 2009-10-04 ~ 2009-10-09 | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Natural Science > Department of Physics > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.