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Origin of critical substrate bias in variable threshold voltage CMOS
- Authors
- 임현식
- Issue Date
- 26-Sep-2001
- Place
- 일본
동경
- Conference Date
- 2001-09-26 ~ 2001-09-28
- Conference Name
- 2001 international conference on solid state devices and materials (SSDM)
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Collections - College of Advanced Convergence Engineering > ETC > 2. Conference Papers
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