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Origin of critical substrate bias in variable threshold voltage CMOS
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 임현식 | - |
| dc.date.accessioned | 2024-10-30T01:58:42Z | - |
| dc.date.available | 2024-10-30T01:58:42Z | - |
| dc.date.issued | 2001-09-26 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/35843 | - |
| dc.title | Origin of critical substrate bias in variable threshold voltage CMOS | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2001 international conference on solid state devices and materials (SSDM) | - |
| dc.citation.conferencePlace | 일본 | - |
| dc.citation.conferencePlace | 동경 | - |
| dc.citation.conferenceDate | 2001-09-26 ~ 2001-09-28 | - |
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