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Relation between deep levels and memory effects in Si/oxide-nitride-oxide/p-Si(100) structures
- Authors
- 조훈영
- Issue Date
- 10-Dec-2003
- Place
- 대한민국
Ramada Plaza, 제주
- Conference Date
- 2003-12-10 ~ 2003-12-12
- Conference Name
- International Conference on Advanced Materials and Devices
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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