A One-Shot Digital Correlated Double Sampling with a Differential Difference Amplifier for a High Speed CMOS Image Sensor
- Authors
- Son, Suho; Jeon, Shiwon; Namgung, Seol; Yoo, Jieun; Song, Minkyu
- Issue Date
- Jul-2015
- Publisher
- IEEE
- Keywords
- one-shot digital correlated double sampling; fixed pattern noise; differential difference amplifier; CMOS Image Sensor
- Citation
- 2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), v.2015-July, pp 1054 - 1057
- Pages
- 4
- Indexed
- SCOPUS
- Journal Title
- 2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS)
- Volume
- 2015-July
- Start Page
- 1054
- End Page
- 1057
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/25273
- DOI
- 10.1109/ISCAS.2015.7168818
- ISSN
- 0271-4302
2158-1525
- Abstract
- In order to raise the operating speed of a CMOS image sensor (CIS), a new technique of digital correlated double sampling (CDS) is described. In general, a fixed pattern noise (FPN) of a CIS has been reduced with the subtraction algorithm between the reset signal and pixel signal. This is because a single-slope analog-to-digital converter (ADC) has been normally adopted in the conventional digital CDS with the reset ramp and signal ramp. Thus, the operating speed of a digital CDS is much slower than that of an analog CDS. In order to improve the operating speed, we propose a one-shot digital CDS based on a differential difference amplifier (DDA) that compares the reset signal and the pixel signal using only one ramp. The prototype CIS has been fabricated with 0.13 mu m CIS technology and it has the VGA resolution of 640x480. The measured conversion time is 16 mu s, and a high frame rate of 131fps is achieved at the VGA resolution.
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Collections - College of Advanced Convergence Engineering > Division of System Semiconductor > 1. Journal Articles

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