Transport behaviors and mechanisms in cuspidal blockade region for silicon single-hole transistor
- Authors
- Lee, Youngmin; Lee, Sejoon; Hiramoto, Toshiro
- Issue Date
- Mar-2014
- Publisher
- ELSEVIER SCIENCE BV
- Keywords
- Silicon single-hole transistor; Room temperature operation; Extended blockade regime; Coulomb blockade oscillation; Negative differential conductance
- Citation
- CURRENT APPLIED PHYSICS, v.14, no.3, pp 428 - 432
- Pages
- 5
- Indexed
- SCI
SCIE
SCOPUS
KCI
- Journal Title
- CURRENT APPLIED PHYSICS
- Volume
- 14
- Number
- 3
- Start Page
- 428
- End Page
- 432
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/24839
- DOI
- 10.1016/j.cap.2013.12.024
- ISSN
- 1567-1739
1878-1675
- Abstract
- The Si single-hole transistor displays the anomalously-extended cuspidal blockade region, which is elongated toward the 45 degrees-tilted direction normal to gate vs. drain bias voltage regions in the Coulomb blockade diagram. This is attributed to the formation of an ultra small Si quantum dot (QD) into the gate-all-around (GAA) stack. Namely, the large one-electron-addition energy (= 447 meV) from the 2-nm-size Si QD enables the clear Coulomb-blockade events at room temperature, and the large voltage gain from the GAA stack allows the cuspidal extension of the blockade region through the renormalization of Coulomb-blockade energies at the adjacent bias points near the initial Coulomb-blockade state. (C) 2013 Elsevier B.V. All rights reserved.
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- Appears in
Collections - College of Advanced Convergence Engineering > Division of System Semiconductor > 1. Journal Articles

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