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Cited 7 time in webofscience Cited 7 time in scopus
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Transport behaviors and mechanisms in cuspidal blockade region for silicon single-hole transistor

Authors
Lee, YoungminLee, SejoonHiramoto, Toshiro
Issue Date
Mar-2014
Publisher
ELSEVIER SCIENCE BV
Keywords
Silicon single-hole transistor; Room temperature operation; Extended blockade regime; Coulomb blockade oscillation; Negative differential conductance
Citation
CURRENT APPLIED PHYSICS, v.14, no.3, pp 428 - 432
Pages
5
Indexed
SCI
SCIE
SCOPUS
KCI
Journal Title
CURRENT APPLIED PHYSICS
Volume
14
Number
3
Start Page
428
End Page
432
URI
https://scholarworks.dongguk.edu/handle/sw.dongguk/24839
DOI
10.1016/j.cap.2013.12.024
ISSN
1567-1739
1878-1675
Abstract
The Si single-hole transistor displays the anomalously-extended cuspidal blockade region, which is elongated toward the 45 degrees-tilted direction normal to gate vs. drain bias voltage regions in the Coulomb blockade diagram. This is attributed to the formation of an ultra small Si quantum dot (QD) into the gate-all-around (GAA) stack. Namely, the large one-electron-addition energy (= 447 meV) from the 2-nm-size Si QD enables the clear Coulomb-blockade events at room temperature, and the large voltage gain from the GAA stack allows the cuspidal extension of the blockade region through the renormalization of Coulomb-blockade energies at the adjacent bias points near the initial Coulomb-blockade state. (C) 2013 Elsevier B.V. All rights reserved.
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