Cited 7 time in
Transport behaviors and mechanisms in cuspidal blockade region for silicon single-hole transistor
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Youngmin | - |
| dc.contributor.author | Lee, Sejoon | - |
| dc.contributor.author | Hiramoto, Toshiro | - |
| dc.date.accessioned | 2024-09-26T11:32:09Z | - |
| dc.date.available | 2024-09-26T11:32:09Z | - |
| dc.date.issued | 2014-03 | - |
| dc.identifier.issn | 1567-1739 | - |
| dc.identifier.issn | 1878-1675 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/24839 | - |
| dc.description.abstract | The Si single-hole transistor displays the anomalously-extended cuspidal blockade region, which is elongated toward the 45 degrees-tilted direction normal to gate vs. drain bias voltage regions in the Coulomb blockade diagram. This is attributed to the formation of an ultra small Si quantum dot (QD) into the gate-all-around (GAA) stack. Namely, the large one-electron-addition energy (= 447 meV) from the 2-nm-size Si QD enables the clear Coulomb-blockade events at room temperature, and the large voltage gain from the GAA stack allows the cuspidal extension of the blockade region through the renormalization of Coulomb-blockade energies at the adjacent bias points near the initial Coulomb-blockade state. (C) 2013 Elsevier B.V. All rights reserved. | - |
| dc.format.extent | 5 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | ELSEVIER SCIENCE BV | - |
| dc.title | Transport behaviors and mechanisms in cuspidal blockade region for silicon single-hole transistor | - |
| dc.type | Article | - |
| dc.publisher.location | 네델란드 | - |
| dc.identifier.doi | 10.1016/j.cap.2013.12.024 | - |
| dc.identifier.scopusid | 2-s2.0-84892766160 | - |
| dc.identifier.wosid | 000331640600037 | - |
| dc.identifier.bibliographicCitation | CURRENT APPLIED PHYSICS, v.14, no.3, pp 428 - 432 | - |
| dc.citation.title | CURRENT APPLIED PHYSICS | - |
| dc.citation.volume | 14 | - |
| dc.citation.number | 3 | - |
| dc.citation.startPage | 428 | - |
| dc.citation.endPage | 432 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.description.journalRegisteredClass | kci | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | NEGATIVE DIFFERENTIAL CONDUCTANCE | - |
| dc.subject.keywordPlus | ELECTRON | - |
| dc.subject.keywordAuthor | Silicon single-hole transistor | - |
| dc.subject.keywordAuthor | Room temperature operation | - |
| dc.subject.keywordAuthor | Extended blockade regime | - |
| dc.subject.keywordAuthor | Coulomb blockade oscillation | - |
| dc.subject.keywordAuthor | Negative differential conductance | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
30, Pildong-ro 1-gil, Jung-gu, Seoul, 04620, Republic of Korea+82-2-2260-3114
Copyright(c) 2023 DONGGUK UNIVERSITY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
