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Cited 7 time in webofscience Cited 7 time in scopus
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Transport behaviors and mechanisms in cuspidal blockade region for silicon single-hole transistor

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dc.contributor.authorLee, Youngmin-
dc.contributor.authorLee, Sejoon-
dc.contributor.authorHiramoto, Toshiro-
dc.date.accessioned2024-09-26T11:32:09Z-
dc.date.available2024-09-26T11:32:09Z-
dc.date.issued2014-03-
dc.identifier.issn1567-1739-
dc.identifier.issn1878-1675-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/24839-
dc.description.abstractThe Si single-hole transistor displays the anomalously-extended cuspidal blockade region, which is elongated toward the 45 degrees-tilted direction normal to gate vs. drain bias voltage regions in the Coulomb blockade diagram. This is attributed to the formation of an ultra small Si quantum dot (QD) into the gate-all-around (GAA) stack. Namely, the large one-electron-addition energy (= 447 meV) from the 2-nm-size Si QD enables the clear Coulomb-blockade events at room temperature, and the large voltage gain from the GAA stack allows the cuspidal extension of the blockade region through the renormalization of Coulomb-blockade energies at the adjacent bias points near the initial Coulomb-blockade state. (C) 2013 Elsevier B.V. All rights reserved.-
dc.format.extent5-
dc.language영어-
dc.language.isoENG-
dc.publisherELSEVIER SCIENCE BV-
dc.titleTransport behaviors and mechanisms in cuspidal blockade region for silicon single-hole transistor-
dc.typeArticle-
dc.publisher.location네델란드-
dc.identifier.doi10.1016/j.cap.2013.12.024-
dc.identifier.scopusid2-s2.0-84892766160-
dc.identifier.wosid000331640600037-
dc.identifier.bibliographicCitationCURRENT APPLIED PHYSICS, v.14, no.3, pp 428 - 432-
dc.citation.titleCURRENT APPLIED PHYSICS-
dc.citation.volume14-
dc.citation.number3-
dc.citation.startPage428-
dc.citation.endPage432-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusNEGATIVE DIFFERENTIAL CONDUCTANCE-
dc.subject.keywordPlusELECTRON-
dc.subject.keywordAuthorSilicon single-hole transistor-
dc.subject.keywordAuthorRoom temperature operation-
dc.subject.keywordAuthorExtended blockade regime-
dc.subject.keywordAuthorCoulomb blockade oscillation-
dc.subject.keywordAuthorNegative differential conductance-
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