Memristors with Nociceptor Characteristics Using Threshold Switching of Pt/HfO2/TaOx/TaN Devicesopen access
- Authors
- Park, Minsu; Jeon, Beomki; Park, Jongmin; Kim, Sungjun
- Issue Date
- Dec-2022
- Publisher
- MDPI
- Keywords
- RRAM; nociceptor; threshold switching; high-k
- Citation
- Nanomaterials, v.12, no.23, pp 1 - 9
- Pages
- 9
- Indexed
- SCIE
SCOPUS
- Journal Title
- Nanomaterials
- Volume
- 12
- Number
- 23
- Start Page
- 1
- End Page
- 9
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/21802
- DOI
- 10.3390/nano12234206
- ISSN
- 2079-4991
2079-4991
- Abstract
- As artificial intelligence technology advances, it is necessary to imitate various biological functions to complete more complex tasks. Among them, studies have been reported on the nociceptor, a critical receptor of sensory neurons that can detect harmful stimuli. Although a complex CMOS circuit is required to electrically realize a nociceptor, a memristor with threshold switching characteristics can implement the nociceptor as a single device. Here, we suggest a memristor with a Pt/HfO2/TaOx/TaN bilayer structure. This device can mimic the characteristics of a nociceptor including the threshold, relaxation, allodynia, and hyperalgesia. Additionally, we contrast different electrical properties according to the thickness of the HfO2 layer. Moreover, Pt/HfO2/TaOx/TaN with a 3 nm thick HfO2 layer has a stable endurance of 1000 cycles and controllable threshold switching characteristics. Finally, this study emphasizes the importance of the material selection and fabrication method in the memristor by comparing Pt/HfO2/TaOx/TaN with Pt/TaOx/TaN, which has insufficient performance to be used as a nociceptor.
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Collections - College of Engineering > Department of Electronics and Electrical Engineering > 1. Journal Articles

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