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Cited 12 time in webofscience Cited 12 time in scopus
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IGZO/SnOx-based dynamic memristor with fading memory effect for reservoir computingopen access

Authors
Lee, SubaekPark, YongjinJung, SungyeopKim, Sungjun
Issue Date
Dec-2023
Publisher
AIP Publishing
Keywords
Brain; High Resolution Transmission Electron Microscopy; Learning Systems; Long Short-term Memory; Pattern Recognition; X Ray Photoelectron Spectroscopy; Conductance Modulations; Current Decay; Fading Memory; High-accuracy; Memory Effects; Memristor; Reservoir Computing; Resistive Switching; Short Term Memory; X-ray Photoelectrons; Memristors; Article; Conductance; Depression; Diagnosis; Female; Human; Learning; Male; Memory; Memristor; Pattern Recognition; Short Term Memory; Synapse; Thickness; Transmission Electron Microscopy; X Ray Photoemission Spectroscopy
Citation
The Journal of Chemical Physics, v.159, no.23, pp 1 - 10
Pages
10
Indexed
SCIE
SCOPUS
Journal Title
The Journal of Chemical Physics
Volume
159
Number
23
Start Page
1
End Page
10
URI
https://scholarworks.dongguk.edu/handle/sw.dongguk/20860
DOI
10.1063/5.0185677
ISSN
0021-9606
1089-7690
Abstract
We investigate a synaptic device with short-term memory characteristics using IGZO/SnOx as the switching layer. The thickness and components of each layer are analyzed by using x-ray photoelectron spectroscopy and transmission electron microscopy. The memristor exhibits analog resistive switching and a volatile feature with current decay over time. Moreover, through ten cycles of potentiation and depression, we demonstrate stable conductance modulation, leading to high-accuracy Modified National Institute of Standards and Technology pattern recognition. We effectively emulate the learning system of a biological synapse, including paired-pulse facilitation, spiking-amplitude-dependent plasticity, and spiking-rate-dependent plasticity (SRDP) by pulse trains. Ultimately, 4-bit reservoir computing divided into 16 states is incarnated using a pulse stream considering short-term memory plasticity and decay properties. © 2023 Author(s).
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