IGZO/SnOx-based dynamic memristor with fading memory effect for reservoir computingopen access
- Authors
- Lee, Subaek; Park, Yongjin; Jung, Sungyeop; Kim, Sungjun
- Issue Date
- Dec-2023
- Publisher
- AIP Publishing
- Keywords
- Brain; High Resolution Transmission Electron Microscopy; Learning Systems; Long Short-term Memory; Pattern Recognition; X Ray Photoelectron Spectroscopy; Conductance Modulations; Current Decay; Fading Memory; High-accuracy; Memory Effects; Memristor; Reservoir Computing; Resistive Switching; Short Term Memory; X-ray Photoelectrons; Memristors; Article; Conductance; Depression; Diagnosis; Female; Human; Learning; Male; Memory; Memristor; Pattern Recognition; Short Term Memory; Synapse; Thickness; Transmission Electron Microscopy; X Ray Photoemission Spectroscopy
- Citation
- The Journal of Chemical Physics, v.159, no.23, pp 1 - 10
- Pages
- 10
- Indexed
- SCIE
SCOPUS
- Journal Title
- The Journal of Chemical Physics
- Volume
- 159
- Number
- 23
- Start Page
- 1
- End Page
- 10
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/20860
- DOI
- 10.1063/5.0185677
- ISSN
- 0021-9606
1089-7690
- Abstract
- We investigate a synaptic device with short-term memory characteristics using IGZO/SnOx as the switching layer. The thickness and components of each layer are analyzed by using x-ray photoelectron spectroscopy and transmission electron microscopy. The memristor exhibits analog resistive switching and a volatile feature with current decay over time. Moreover, through ten cycles of potentiation and depression, we demonstrate stable conductance modulation, leading to high-accuracy Modified National Institute of Standards and Technology pattern recognition. We effectively emulate the learning system of a biological synapse, including paired-pulse facilitation, spiking-amplitude-dependent plasticity, and spiking-rate-dependent plasticity (SRDP) by pulse trains. Ultimately, 4-bit reservoir computing divided into 16 states is incarnated using a pulse stream considering short-term memory plasticity and decay properties. © 2023 Author(s).
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- Appears in
Collections - College of Engineering > Department of Electronics and Electrical Engineering > 1. Journal Articles

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