A 0.57 mW@1 FPS In-Column Analog CNN Processor Integrated Into CMOS Image Sensoropen access
- Authors
- Jeong, Bohyeok; Lee, Jaehwan; Choi, Jaihyuk; Song, Minkyu; Son, Youngdoo; Kim, Soo Youn
- Issue Date
- 2023
- Publisher
- IEEE
- Keywords
- Convolutional neural networks; CMOS technology; Voltage; Image resolution; Face detection; Quantization (signal); Image sensors; CMOS image sensor; convolutional neural networks; face detection; multiplication-and-accumulation; nonlinear quantization
- Citation
- IEEE Access, v.11, pp 61082 - 61090
- Pages
- 9
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE Access
- Volume
- 11
- Start Page
- 61082
- End Page
- 61090
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/19378
- DOI
- 10.1109/ACCESS.2023.3286544
- ISSN
- 2169-3536
2169-3536
- Abstract
- This article presents a high-performance, low-power analog convolutional neural network (CNN) circuit integrated into a CMOS image sensor (CIS) for face detection applications. The main block of the proposed in-column analog CNN circuits is an analog multiplication-and-accumulation (MAC) circuit consisting of an operational transconductance amplifier-based switched capacitor circuit enabling the programmable weight function. With the proposed MAC, a 3-layer analog CNN processor is implemented into the column-parallel readout circuit in conventional CIS. Furthermore, for low-power CNN operations, we use a low-resolution analog-to-digital converter with the proposed nonlinear quantization method resulting in an increase in the accuracy of face detection from 92.8% to 98.75% at 120 frame rates with 2.8 V/1.5 V supply voltage. A prototype sensor with $160\times120$ effective image resolution was fabricated using a 110 nm CMOS image sensor process. The measurement results showed that the maximum power consumption was 0.57 mW and 4.02 mW at 1 and 120 frame rates, respectively.
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- Appears in
Collections - College of Engineering > Department of Industrial and Systems Engineering > 1. Journal Articles
- College of Advanced Convergence Engineering > Division of System Semiconductor > 1. Journal Articles

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