Analysis and Verification of DLL-Based GFSK Demodulator Using Multiple-IF-Period Delay Line
- Authors
- Byun, Sangjin
- Issue Date
- Jan-2017
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- Bit error rate (BER); CMOS integrated circuits; demodulator; frequency-shift keying (FSK)
- Citation
- IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.64, no.1, pp 6 - 10
- Pages
- 5
- Indexed
- SCI
SCIE
SCOPUS
- Journal Title
- IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
- Volume
- 64
- Number
- 1
- Start Page
- 6
- End Page
- 10
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/19094
- DOI
- 10.1109/TCSII.2016.2543144
- ISSN
- 1549-7747
1558-3791
- Abstract
- This brief presents a delay-locked-loop-based Gaussian frequency-shift keying (FSK) demodulator using a multiple-IF-period delay line. Theoretical analysis of the bit error rate (BER) performance is developed. The analysis result implies that the BER can be improved when a multiple-IF-period delay line is used instead of a single-IF-period delay line. To verify the analysis, a prototype chip was fabricated in a 0.11-mu m CMOS process. When a binary Gaussian FSK (GFSK) signal carries 1-Mb/s data on a 3-MHz center frequency with a 160-kHz frequency deviation, the minimum required signal-to-noise ratio for 0.1% BER is reduced from 17.5 to 12.5 dB when a triple-IF-period delay line is used instead of a single-IF-period delay line. The implemented GFSK demodulator consumes 0.8 mA from a 1.2-V supply voltage.
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Collections - College of Engineering > Department of Electronics and Electrical Engineering > 1. Journal Articles

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