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Analysis and Verification of DLL-Based GFSK Demodulator Using Multiple-IF-Period Delay Line

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dc.contributor.authorByun, Sangjin-
dc.date.accessioned2024-08-08T06:31:06Z-
dc.date.available2024-08-08T06:31:06Z-
dc.date.issued2017-01-
dc.identifier.issn1549-7747-
dc.identifier.issn1558-3791-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/19094-
dc.description.abstractThis brief presents a delay-locked-loop-based Gaussian frequency-shift keying (FSK) demodulator using a multiple-IF-period delay line. Theoretical analysis of the bit error rate (BER) performance is developed. The analysis result implies that the BER can be improved when a multiple-IF-period delay line is used instead of a single-IF-period delay line. To verify the analysis, a prototype chip was fabricated in a 0.11-mu m CMOS process. When a binary Gaussian FSK (GFSK) signal carries 1-Mb/s data on a 3-MHz center frequency with a 160-kHz frequency deviation, the minimum required signal-to-noise ratio for 0.1% BER is reduced from 17.5 to 12.5 dB when a triple-IF-period delay line is used instead of a single-IF-period delay line. The implemented GFSK demodulator consumes 0.8 mA from a 1.2-V supply voltage.-
dc.format.extent5-
dc.language영어-
dc.language.isoENG-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleAnalysis and Verification of DLL-Based GFSK Demodulator Using Multiple-IF-Period Delay Line-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/TCSII.2016.2543144-
dc.identifier.scopusid2-s2.0-85008507399-
dc.identifier.wosid000391721900007-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.64, no.1, pp 6 - 10-
dc.citation.titleIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS-
dc.citation.volume64-
dc.citation.number1-
dc.citation.startPage6-
dc.citation.endPage10-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusBLUETOOTH-
dc.subject.keywordPlusTRANSCEIVER-
dc.subject.keywordAuthorBit error rate (BER)-
dc.subject.keywordAuthorCMOS integrated circuits-
dc.subject.keywordAuthordemodulator-
dc.subject.keywordAuthorfrequency-shift keying (FSK)-
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