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Reliability of Crystalline Indium-Gallium-Zinc-Oxide Thin-Film Transistors Under Bias Stress With Light Illumination

Park, Kyung; Park, Hyun-Woo; Shin, Hyun Soo; Bae, Jonguk; Park, Kwon-Shik; Kang, Inbyeong; Chung, Kwun-Bum; Kwon, Jang-Yeon

ArticleIssue Date2015CitationIEEE TRANSACTIONS ON ELECTRON DEVICES, v.62, no.9, pp 2900 - 2905PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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