Han, Jung Hoon; Shin, Dong Yeob; Sung, Chihun; Cho, Sung Haeng; Ju, Byeong-Kwon; Chung, Kwun-Bum; Nam, Sooji
ArticleIssue Date2024CitationDigest of Technical Papers - SID International Symposium, v.55, no.1, pp 1452 - 1454PublisherJohn Wiley and Sons Inc