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Browsing by Ahn, Il-HoAuthor

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A new method of carrier density measurement using photocurrent maps of a 2D material Schottky diodeopen access

Ahn, Il-Ho; Ahn, Jongtae; Hwang, Do Kyung; Kim, Deuk Young

ArticleIssue Date2021CitationRESULTS IN PHYSICS, v.21PublisherELSEVIER
SCISCIESCOPUSKCI
An alternative method for measurement of charge carrier mobility in semiconductors using photocurrent transient response

Ahn, Il-Ho; Kyhm, Jihoon; Lee, Juwon; Cho, Sangeun; Jo, Yongcheol; Kim, Deuk Young; Choi, Soo Ho; Yang, Woochul

ArticleIssue Date2019CitationCURRENT APPLIED PHYSICS, v.19, no.4, pp 498 - 502PublisherELSEVIER SCIENCE BV
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Auxiliary Diagnostic Signal for Deep-Level Detectionopen access

Ahn, Il-Ho; Lee, Dong Jin; Kim, Deuk Young

ArticleIssue Date2023CitationNanomaterials, v.13, no.21, pp 1 - 11PublisherMDPI
SCIESCOPUS
Correlation between Optical Localization-State and Electrical Deep-Level State in In0.52Al0.48As/In0.53Ga0.47As Quantum Well Structureopen access

Ahn, Il-Ho; Kim, Deuk Young; Lee, Sejoon

ArticleIssue Date2021CitationNANOMATERIALS, v.11, no.3, pp 1 - 8PublisherMDPI
SCIESCOPUS
Enhanced UV photodetectivity in solution driven ZnO nanosheets via piezo-phototronic effectopen access

Lee, Dong Jin; Ryu, Sung Ryong; Kumar, Ganesan Mohan; Ahn, Il-Ho; Kyhm, Jihoon; Kim, Deuk Young; Ilanchezhiyan, Pugazhendi

ArticleIssue Date2021CitationJOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T, v.13, pp 397 - 407PublisherELSEVIER
SCIESCOPUS
Inspection of the Defect State Using the Mobility Spectrum Analysis Methodopen access

Ahn, Il-Ho; Kim, Deuk Young; Yang, Woochul

ArticleIssue Date2022CitationNanomaterials, v.12, no.16, pp 1 - 11PublisherMDPI
SCIESCOPUSKCI
Mobility-Spectrum Analysis of an Anisotropic Material System with a Single-Valley Indirect-Band-Gap Semiconductor Quantum-Well

Joung, Hodoug; Ahn, Il-Ho; Yang, Woochul; Kim, Deuk Young

ArticleIssue Date2018CitationELECTRONIC MATERIALS LETTERS, v.14, no.6, pp 774 - 783PublisherKOREAN INST METALS MATERIALS
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