ScholarWorks@Dongguk University

Proceedings -Design, Automation and Test in Europe, DATE

Journal Title

  • Proceedings -Design, Automation and Test in Europe, DATE

ISSN

  • 1530-1591

Publisher

Listed on(Coverage)

SJR 1999-2017
SCOPUS 2017;2024

Active

  • NA

Article List

1 - 1 out of 1 results.

SCOPUS
Fast Chip-Package-PCB Coanalysis Methodology for Power Integrity of Multi-Domain High-Speed Memory: A Case Study

Kim, Seungwon; Han, Ki Jin; Kim, Youngmin; Kang, Seokhyeong

ArticleIssue Date2018CitationPROCEEDINGS OF THE 2018 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), v.2018-January, pp 885 - 888PublisherIEEE
1
CONTACT US

RSS_1.0 RSS_2.0 ATOM_1.0

30, Pildong-ro 1-gil, Jung-gu, Seoul, 04620, Republic of Korea+82-2-2260-3114

Copyright(c) 2023 DONGGUK UNIVERSITY. ALL RIGHTS RESERVED.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

BROWSE

한국어