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IEEE Electron Device Letters

Journal Title

  • IEEE Electron Device Letters

ISSN

  • E 1558-0563 | P 0741-3106

Publisher

  • Institute of Electrical and Electronics Engineers

Listed on(Coverage)

JCR 1997-2023
SJR 1999-2020;2022-2023
CiteScore 2011-2023
SCI 2010-2019
SCIE 2010-2024
CC 2016-2024
SCOPUS 2017-2024

Active

  • Active

    based on the information

    • SCOPUS:2024-10

Country

  • USA

Aime & Scopes

  • IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.

Homepage

Article List

1 - 5 out of 5 results.

SCIESCOPUS
Thin-film Photogate Pixel with Fixed Photodiode Bias for Near-infrared Imaging

Jin, Minhyun; Georgitzikis, Epimitheas; Hermans, Yannick; Chandrasekaran, Naresh; Li, Yunlong; Kim, Joo Hyoung; Kim, Soo Youn; Malinowski, Pawel E.; Lee, Jiwon

ArticleIssue Date2023CitationIEEE Electron Device Letters, v.44, no.12, pp 2007 - 2010PublisherInstitute of Electrical and Electronics Engineers Inc.
SCIESCOPUS
Performance Enhancement of Silicon-Based Sub-Terahertz Detector by Highly Localized Plasmonic Wave in Nano-Ring FETopen access

Jang, E-San; Ryu, Min Woo; Patel, Ramesh; Ahn, Sang Hyo; Han, Ki Jin; Kim, Kyung Rok

ArticleIssue Date2021CitationIEEE ELECTRON DEVICE LETTERS, v.42, no.12, pp 1719 - 1722PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
Reduction of Local Thermal Effects in FinFETs With a Heat-Path Design Methodology

Jin, Minhyun; Lee, Young Ju; Kim, Soo Youn

ArticleIssue Date2021CitationIEEE ELECTRON DEVICE LETTERS, v.42, no.4, pp 461 - 464PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCISCIESCOPUS
Device Process and Circuit Application Interaction for Harsh Electronics: Hf-In-Zn-O Thin Film Transistors as an Exampleopen access

Ho, Chih-Hsiang; Tsai, Dung-Sheng; Lu, Chao; Kim, Soo Youn; Mungan, Selin; Yang, Shih-Guo; Zhang, Yuanzhi; He, Jr-Hau

ArticleIssue Date2017CitationIEEE ELECTRON DEVICE LETTERS, v.38, no.8, pp 1039 - 1042PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCISCIESCOPUS
Performance Booster for Vertical Tunnel Field-Effect Transistor: Field-Enhanced High-kappa Layer

Lee, Hyunjae; Park, Jung-Dong; Shin, Changhwan

ArticleIssue Date2016CitationIEEE ELECTRON DEVICE LETTERS, v.37, no.11, pp 1383 - 1386PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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