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Thin film fabrication of CdS quantum dots on GaAs substrate by surfactant self-assemblyThin film fabrication of CdS quantum dots on GaAs substrate by surfactant self-assembly

Other Titles
Thin film fabrication of CdS quantum dots on GaAs substrate by surfactant self-assembly
Authors
Park, SangkwonKong, Hyun-Suk
Issue Date
Aug-2018
Publisher
KOREAN ASSOC CRYSTAL GROWTH, INC
Keywords
Cadmium sulfide; Quantum dots; Microemulsion-based synthesis; Self-assembled monolayer; Thin film fabrication
Citation
JOURNAL OF CERAMIC PROCESSING RESEARCH, v.19, no.4, pp 337 - 341
Pages
5
Indexed
SCI
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF CERAMIC PROCESSING RESEARCH
Volume
19
Number
4
Start Page
337
End Page
341
URI
https://scholarworks.dongguk.edu/handle/sw.dongguk/9281
DOI
10.36410/jcpr.2018.19.4.337
ISSN
1229-9162
2672-152X
Abstract
In this study, cadmium sulfide (CdS) quantum dots (QDs) were synthesized using a microemulsion-based synthesis method, in which two microemulsions containing precursors of Cd2+ and S2-, were mixed to form CdS QDs. The time-course variation in the average particle size was measured by UV-visible absorption spectroscopy. Subsequently, a thin film of CdS QDs was fabricated using a self-assembled monolayer (SAM) technique. First, undoped GaAs (100) wafers were cleaned and etched using HCl aqueous solution, and a SAM of 1,6-hexanedithiol was formed on the etched wafer surface using a typical SAM technique. Finally, CdS-dithiol-GaAs structures were fabricated by immersing the SAM-coated wafer in dispersion solutions of CdS QDs. In the serial steps of the fabrication of CdS QD thin films, the wafer surface was analyzed, and thin film formation was confirmed by contact angle measurement, atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS).
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