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Memristive and Synaptic Characteristics of Nitride-Based Heterostructures on Si Substrate

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dc.contributor.authorRahmani, Mehr Khalid-
dc.contributor.authorKim, Min-Hwi-
dc.contributor.authorHussain, Fayyaz-
dc.contributor.authorAbbas, Yawar-
dc.contributor.authorIsmail, Muhammad-
dc.contributor.authorHong, Kyungho-
dc.contributor.authorMahata, Chandreswar-
dc.contributor.authorChoi, Changhwan-
dc.contributor.authorPark, Byung-Gook-
dc.contributor.authorKim, Sungjun-
dc.date.accessioned2023-04-27T23:40:39Z-
dc.date.available2023-04-27T23:40:39Z-
dc.date.issued2020-05-
dc.identifier.issn2079-4991-
dc.identifier.issn2079-4991-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/6657-
dc.description.abstractBrain-inspired artificial synaptic devices and neurons have the potential for application in future neuromorphic computing as they consume low energy. In this study, the memristive switching characteristics of a nitride-based device with two amorphous layers (SiN/BN) is investigated. We demonstrate the coexistence of filamentary (abrupt) and interface (homogeneous) switching of Ni/SiN/BN/n(++)-Si devices. A better gradual conductance modulation is achieved for interface-type switching as compared with filamentary switching for an artificial synaptic device using appropriate voltage pulse stimulations. The improved classification accuracy for the interface switching (85.6%) is confirmed and compared to the accuracy of the filamentary switching mode (75.1%) by a three-layer neural network (784 x 128 x 10). Furthermore, the spike-timing-dependent plasticity characteristics of the synaptic device are also demonstrated. The results indicate the possibility of achieving an artificial synapse with a bilayer SiN/BN structure.-
dc.language영어-
dc.language.isoENG-
dc.publisherMDPI-
dc.titleMemristive and Synaptic Characteristics of Nitride-Based Heterostructures on Si Substrate-
dc.typeArticle-
dc.publisher.location스위스-
dc.identifier.doi10.3390/nano10050994-
dc.identifier.scopusid2-s2.0-85085161049-
dc.identifier.wosid000540781800177-
dc.identifier.bibliographicCitationNANOMATERIALS, v.10, no.5-
dc.citation.titleNANOMATERIALS-
dc.citation.volume10-
dc.citation.number5-
dc.type.docTypeArticle-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusRESISTIVE SWITCHING MEMORY-
dc.subject.keywordPlusPHASE-CHANGE MEMORY-
dc.subject.keywordPlusDEPENDENCE-
dc.subject.keywordPlusSYNAPSES-
dc.subject.keywordAuthormemristor-
dc.subject.keywordAuthorsilicon nitride-
dc.subject.keywordAuthorboron nitride-
dc.subject.keywordAuthorneuromorphic computing-
dc.subject.keywordAuthorresistive switching-
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