Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Advanced Side-Channel Evaluation Using Contextual Deep Learning-Based Leakage Modelingopen access

Authors
Alabdulwahab, SalehKim, JaeCheolKim, Young-TakSon, Yunsik
Issue Date
Feb-2026
Publisher
Association for Computing Machinery
Keywords
Deep learning; Disassemble; Reverse engineering; Side channel attacks
Citation
ACM Transactions on Software Engineering and Methodology, v.35, no.2
Indexed
SCIE
SCOPUS
Journal Title
ACM Transactions on Software Engineering and Methodology
Volume
35
Number
2
URI
https://scholarworks.dongguk.edu/handle/sw.dongguk/63885
DOI
10.1145/3734219
ISSN
1049-331X
1557-7392
Abstract
Side-channel attacks (SCAs) exploit power analysis to extract secret information. Researchers have employed this technique to disassemble software and retrieve cryptographic keys by examining power consumption or electromagnetic emissions. They utilized hardware or Hamming-based fluctuations measurement to profile or model the power leakage. Developers employ power modeling to comprehend software leakage, although manually profiling the power trace across various devices and architectures requires time and effort. This work proposes a custom deep learning (DL) method to model the power trace. The DL model was trained to analyze how each assembly instruction produces leakage based on its context with other instructions. The proposed method can predict the power trace with 0.9963 R² from unseen assembly instructions. This method automates device leakage testing and captures contextual and non-linear relationships to help developers understand the software behavior, significantly reducing the time and effort required for power modeling. The potential impact of this DL model on software security is that it can effectively mitigate the risk of SCAs, thus enhancing the overall security of software systems. © 2026 Copyright held by the owner/author(s).
Files in This Item
There are no files associated with this item.
Appears in
Collections
ETC > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Son, Yun Sik photo

Son, Yun Sik
College of Advanced Convergence Engineering (Department of Computer Science and Artificial Intelligence)
Read more

Altmetrics

Total Views & Downloads

BROWSE