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Interfacial AlOx-insertion-driven synaptic enhancement and tunneling control in HfO2-based ferroelectric MIFS memristors

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dc.contributor.authorChae, Hyojeong-
dc.contributor.authorKo, Minsu-
dc.contributor.authorKim, Sungjun-
dc.date.accessioned2026-02-10T03:00:25Z-
dc.date.available2026-02-10T03:00:25Z-
dc.date.issued2026-02-
dc.identifier.issn0925-8388-
dc.identifier.issn1873-4669-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/63671-
dc.description.abstractHafnia-based ferroelectric memristors are promising candidates for next-generation neuromorphic computing owing to their ability to emulate biological synaptic functions with excellent scalability, non-volatility, and CMOS compatibility. In this work, we investigate a metal–insulator–ferroelectric–semiconductor (MIFS) structure and compare it with a conventional metal–ferroelectric–semiconductor (MFS) device. Electrical characterization reveals that the MIFS device exhibits a wider memory window, a high tunneling electro-resistance (TER) ratio of ∼538 %, and superior array scalability (up to 253 × 253, as estimated by array level simulation) enabled by effective suppression of sneak-path currents. Moreover, the MIFS structure successfully reproduces essential synaptic behaviors such as paired-pulse facilitation (PPF), potentiation/depression, and excitatory postsynaptic current (EPSC), demonstrating its suitability for neuromorphic operation. When integrated as a reservoir layer in a reservoir computing (RC) system, the device achieved 97.48 % classification accuracy on the MNIST dataset, validating its potential for hardware-based neuromorphic computing. Additionally, the gradual and symmetric current modulation with stable retention enables controllable analog synaptic functionalities, highlighting the versatility of the enhanced MIFS architecture for next-generation neuromorphic systems. © 2026 Elsevier B.V.-
dc.format.extent12-
dc.language영어-
dc.language.isoENG-
dc.publisherElsevier Ltd-
dc.titleInterfacial AlOx-insertion-driven synaptic enhancement and tunneling control in HfO2-based ferroelectric MIFS memristors-
dc.typeArticle-
dc.publisher.location네델란드-
dc.identifier.doi10.1016/j.jallcom.2026.186549-
dc.identifier.scopusid2-s2.0-105029055458-
dc.identifier.wosid001684714900001-
dc.identifier.bibliographicCitationJournal of Alloys and Compounds, v.1055, pp 1 - 12-
dc.citation.titleJournal of Alloys and Compounds-
dc.citation.volume1055-
dc.citation.startPage1-
dc.citation.endPage12-
dc.type.docTypeArticle-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaMetallurgy & Metallurgical Engineering-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMetallurgy & Metallurgical Engineering-
dc.subject.keywordAuthorAluminum oxide-
dc.subject.keywordAuthorFerroelectric-
dc.subject.keywordAuthorHafnium-
dc.subject.keywordAuthorMemristor-
dc.subject.keywordAuthorNeuromorphic computing-
dc.subject.keywordAuthorSynaptic device-
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