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Nonlinear quantized conductance dynamics in vertical SiN RRAM for scalable memory-learning integration

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dc.contributor.authorPark, Jihee-
dc.contributor.authorKim, Nawoon-
dc.contributor.authorNa, Hyesung-
dc.contributor.authorKim, Hyungjin-
dc.contributor.authorKim, Sungjun-
dc.date.accessioned2026-01-19T08:00:07Z-
dc.date.available2026-01-19T08:00:07Z-
dc.date.issued2026-09-
dc.identifier.issn1005-0302-
dc.identifier.issn1941-1162-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/63456-
dc.description.abstractWe report a vertical resistive random-access memory device based on a Pt/SiN/Ti stack, designed for multi-bit storage and neuromorphic computing. The device exhibits stable bipolar switching and achieves up to 7-bit (128-level) conductance states through precise control of compliance current and reset voltage. Quantized conductance plateaus, corresponding to integer and half-integer multiples of the quantum conductance G<inf>0</inf> = 2e2/h, reveal atomic-scale filament dynamics governed by nonlinear conduction processes. Diverse synaptic plasticity functions, including spike-number-, spike-rate-, spike-duration-, and spike-amplitude-dependent plasticity, were experimentally emulated. Neuromorphic simulations for the Modified National Institute of Standards and Technology dataset achieved classification accuracies exceeding 94 %, confirming the device's suitability for high-precision weight modulation. The vertical architecture ensures scalability toward three-dimensional integration, while robust retention and compatibility with current-based multi-bit modulation highlight its potential for complex-system-inspired edge AI and in-memory computing hardware. © 2025-
dc.format.extent16-
dc.language영어-
dc.language.isoENG-
dc.publisherElsevier Ltd-
dc.titleNonlinear quantized conductance dynamics in vertical SiN RRAM for scalable memory-learning integration-
dc.typeArticle-
dc.publisher.location네델란드-
dc.identifier.doi10.1016/j.jmst.2025.11.034-
dc.identifier.scopusid2-s2.0-105026656778-
dc.identifier.wosid001666594200001-
dc.identifier.bibliographicCitationJournal of Materials Science & Technology, v.266, pp 76 - 91-
dc.citation.titleJournal of Materials Science & Technology-
dc.citation.volume266-
dc.citation.startPage76-
dc.citation.endPage91-
dc.type.docTypeArticle-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaMetallurgy & Metallurgical Engineering-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMetallurgy & Metallurgical Engineering-
dc.subject.keywordPlusRANDOM-ACCESS MEMORY-
dc.subject.keywordPlusRESISTIVE SWITCHING CHARACTERISTICS-
dc.subject.keywordPlusLOW-POWER-
dc.subject.keywordPlusARCHITECTURE-
dc.subject.keywordPlusDEVICES-
dc.subject.keywordPlusEVOLUTION-
dc.subject.keywordPlusMECHANISMS-
dc.subject.keywordPlusTRAP-
dc.subject.keywordPlusHFOX-
dc.subject.keywordAuthorConductance quantization-
dc.subject.keywordAuthorMulti-bit memory-
dc.subject.keywordAuthorNeuromorphic computing-
dc.subject.keywordAuthorSynaptic plasticity-
dc.subject.keywordAuthorVertical rram-
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