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Influence of Hydrogen Defect Control on the Ultra-high Mobility IGZO Thin-Film Transistors
- Authors
- 김현석
- Issue Date
- 22-Aug-2025
- Place
- 대한민국
- Conference Name
- IMID 2025
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Related Researcher
- Kim, Hyun Suk
- College of Engineering (Department of Energy and Materials Engineering)