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An Integrated Framework for Technology–Business Opportunity Discovery Using Trademark–Patent Embeddings and Anomaly Detection
- Authors
- 윤병운
- Issue Date
- 9-Dec-2025
- Conference Name
- IEEE TRANSACTIONS ON ENGINEERING MANAGEMENT
- Place
- 미국
- Conference Name
- IEEE International Conference on Industrial Engineering and Engineering Management
- ISSN
- 0018-9391
1558-0040
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Related Researcher
- Yoon, Byung Un
- College of Engineering (Department of Industrial and Systems Engineering)